原子力顯微鏡
Easy to change modules Unbelievable low pric Atomic Force Microscope MS-818 AFM:
Easy to change modules
Unbelievable low pric
- Atomic Force Microscope MS-818 AFM:
- Innovative: A novel optical astigmatism technique
- Available: Unbelievable low price in the market and you could choose any different function modules you need.
- Convenient: Easy to use and easy probe-changing
- Flexible: LabVIEW software makes easy expansion
- Modularization: Easy to change modules to get different signals you want.
- Passive isolation is integrated.
| Main Functions | |
|
operation mode |
DC mode, AC mode |
|
static force-distance |
Yes |
|
dynamic force-distance |
Yes |
|
phase imaging |
Yes |
|
automatic probe approach |
Yes |
|
probe orientation adjustment |
Yes |
|
external eletric connection to tip / sample |
Yes |
|
Scanner (X/Y/Z) |
|
|
scanning range |
20µm / 20µm / 2µm |
|
drive resolution |
0.3nm / 0.3nm /0.03nm |
|
Z spatial resolution |
0.2nm |
|
Sample |
|
| size | diameter 10 mm × thickness 5 mm |
| maximum weight | 50g |
| XY sample positioning | 10 × 10 mm, motoized |
|
AFM Software Function |
|
|
operation system |
Windows XP / Vista |
| development platform | LabVIEW |
| communication interface |
USB 2.0 (1.0, 1.1 compatible) |
|
raw data export |
Yes (txt file) |
|
scan image export |
Yes (bmp file) |
|
scanning mode |
line / frame |
|
scan angle |
0~360 degree |
|
real time flatten |
line flatten / frame flatten |
| Image Analysis Functions | |
|
line profile measurement |
Yes |
|
contrast and bright adjustment |
Yes |
|
multiple color palettes |
Yes |
|
3D image |
Yes |
|
height measurement |
Yes |
|
roughness measurement |
Yes |
|
Electronics |
|
|
stimultaneous image |
3 channels |
|
AD resolution |
16 bit |
|
AD sampling rate |
100 kHz |
|
power rating |
100~240V / 50~60Hz / 180W |
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